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Proceedings Paper

Electromagnetic models for the analysis and design of complex diffractive microstructures
Author(s): Tuomas Vallius; Jari Turunen
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Paper Abstract

A review of electromagnetic models for the analysis of complex microstructures for controlling optical fields is provided. An overview of the most useful rigorous approaches and indications of their computational complexity as well as their domain of applicability is first presented. Then two types of approximate electromagnetic approaches are discusses: local interface techniques and local perturbation methods. These are compared to rigorous methods with a view on computational complexity and domain of applicability.

Paper Details

Date Published: 20 January 2006
PDF: 4 pages
Proc. SPIE 6027, ICO20: Optical Information Processing, 602704 (20 January 2006); doi: 10.1117/12.667699
Show Author Affiliations
Tuomas Vallius, Joensuu Yliopisto (Finland)
Jari Turunen, Joensuu Yliopisto (Finland)


Published in SPIE Proceedings Vol. 6027:
ICO20: Optical Information Processing
Yunlong Sheng; Songlin Zhuang; Yimo Zhang, Editor(s)

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