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Proceedings Paper

Evolution of geometrical scale for microscopic particles based on the phase of interference and de Broglie wave
Author(s): Ruogo Zhu; Keining Zhou; Yu Huang; Guo Bing
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Paper Abstract

With the deep research of measurement for microscopic or nanometer level scale at present the concept of Critical Dimension(CD) is pointed out in many papers[1,4,], they always include some analyses of measuring uncertainty for current technology of measurement, but our new idea or definition for geometrical action scale (GAS) is the limited scale or uncertainty of measurement in microscope that we can approach to for the most advanced method, technology, set-up or instrument, for example: The modern interferometer, SPM[5] and other various scattering experiments using the beam of microscopic particles. It would be found that the research included fundamentals for microscopic particle geometric scale is not easy to explore, some reasons perhaps are affected by which the classical quantum mechanics study of matter usually start from energy or energy level not from geometrical scale and by the Heisenberg relation of measuring uncertainty. Our work just wants to research on these fundamentals in physics for microscopic particles geometric scale. At first, a new physical quantity relative to microscopic particle geometric scale is directly suggested in this paper, it also may be deduced from the completeness of units system or dimension system refer to optics principles or quantum optics principles. We find that the wavelength of Louis de Broglie matter wave is either the length dimension or relative to the geometric scale of microscopic particles, and we define it as the geometrical action scale (GAS) of microscopic particles. The significance of the geometrical scale of microscopic particles or GAS in physics is discussed.

Paper Details

Date Published: 23 January 2006
PDF: 5 pages
Proc. SPIE 6029, ICO20: Materials and Nanostructures, 602907 (23 January 2006); doi: 10.1117/12.667664
Show Author Affiliations
Ruogo Zhu, China Jiliang Univ. (China)
Keining Zhou, Zhejiang Univ. of Science and Technology (China)
Yu Huang, China Jiliang Univ. (China)
Guo Bing, China Jiliang Univ. (China)

Published in SPIE Proceedings Vol. 6029:
ICO20: Materials and Nanostructures
Wei Lu; Jeff Young, Editor(s)

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