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Proceedings Paper

Fast multispectral liquid-crystal-on-silicon spatial light modulators
Author(s): Guoqiang Zhang; Anatoliy Glushchenko; John L. West; John R. McNeil; Michael J. O'Callaghan; Mark A. Handschy; Kerry Lane; Stephen D. Gaalema
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Paper Abstract

The stressed liquid-crystal (SLC) electro-optic effect promises fast electro-optic response times even for design wavelengths in the infrared (IR). Here we report characteristics of SLC devices appropriate for use as liquid-crystal-onsilicon (LCOS) spatial light modulators (SLMs) in the near ( λ = 1.8-2.5 μm), mid (3-5.5 μm) and far (8-14 μm) IR bands. For these three bands we fabricated SLC devices with 5, 10, and 20 μm thicknesses; at drive voltages of 25, 50, and 125 V respectively these devices gave half-wave modulation with response speeds in the 1.3-1.6 ms range. Visiblelight measurements on a 20-μm-thick SLC device between crossed polarizers gave a contrast ratio of 360:1 which improved to nearly 18,000:1 with a Babinet-Soleil compensator offsetting residual SLC retardance. Widely available high-voltage options in standard CMOS processes offer sufficient drive for near- and mid-IR SLCOS devices; with modest increase of SLC material birefringence Δn and dielectric anisotropy Δε far-IR devices would be feasible, too. Pixel drivers utilizing these options have pitches less than 24 μm, making 1000 ×1000 SLMs feasible.

Paper Details

Date Published: 16 May 2006
PDF: 7 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080T (16 May 2006); doi: 10.1117/12.667618
Show Author Affiliations
Guoqiang Zhang, Kent State Univ. (United States)
Anatoliy Glushchenko, Kent State Univ. (United States)
John L. West, Kent State Univ. (United States)
John R. McNeil, Displaytech, Inc. (United States)
Michael J. O'Callaghan, Displaytech, Inc. (United States)
Mark A. Handschy, Displaytech, Inc. (United States)
Kerry Lane, Black Forest Engineering (United States)
Stephen D. Gaalema, Black Forest Engineering (United States)


Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer, Editor(s)

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