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Proceedings Paper

Quantum efficiency characterization of back-illuminated CCDs: Part II. Reflectivity measurements
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Paper Abstract

The usual QE measurement heavily relies on a calibrated photodiode (PD) and the knowledge of the CCD's gain. Either can introduce significant systematic errors. But 1-R ≥QE, where R is the reflectivity. Over a significant wavelength range, 1-R = QE. An unconventional reflectometer has been developed to make this measurement. R is measured in two steps, using light from the lateral monochromator port via an optical fiber. The beam intensity is measured directly with a PD, then both the PD and CCD are moved so that the optical path length is unchanged and the light reflects once from the CCD; the PD current ratio is R. Unlike the traditional VW scheme this approach makes only one reflection from the CCD surface. Since the reflectivity of the LBNL CCDs might be as low as 2% this increases the signal to noise ratio dramatically. The goal is a 1% accuracy. We obtain good agreement between 1 - R and the direct QE results.

Paper Details

Date Published: 6 February 2006
PDF: 11 pages
Proc. SPIE 6068, Sensors, Cameras, and Systems for Scientific/Industrial Applications VII, 60680G (6 February 2006); doi: 10.1117/12.667314
Show Author Affiliations
Maximilian H. Fabricius, Lawrence Berkeley National Lab. (United States)
Chris J. Bebek, Lawrence Berkeley National Lab. (United States)
Donald E. Groom, Lawrence Berkeley National Lab. (United States)
Armin Karcher, Lawrence Berkeley National Lab. (United States)
Natalie A. Roe, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 6068:
Sensors, Cameras, and Systems for Scientific/Industrial Applications VII
Morley M. Blouke, Editor(s)

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