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Proceedings Paper

Quantum efficiency characterization of LBNL CCD's: Part I. The quantum efficiency machine
Author(s): Donald E. Groom; Christopher J. Bebek; Maximilian Fabricius; Armin Karcher; William F. Kolbe; Natalie A. Roe; Jens Steckert
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Paper Abstract

Instrumentation was developed in 2004 and 2005 to measure the quantum efficiency of the Lawrence Berkeley National Lab (LBNL) total-depletion CCD's, intended for astronomy and space applications. This paper describes the basic instrument. Although it is conventional even to the parts list, there are important innovations. A xenon arc light source was chosen for its high blue/UV and low red/IR output as compared with a tungsten light. Intensity stabilization has been difficult, but since only flux ratios matter this is not critical. Between the light source and an Oriel MS257 monochromator are a shutter and two filter wheels. High-bandpass and low-bandpass filter pairs isolate the 150-nm wide bands appropriate to the wavelength, thus minimizing scattered light and providing order blocking. Light from the auxiliary port enters a 20-inch optical sphere, and the 4-inch output port is at right angles to the input port. An 80 cm drift space produces near-uniform illumination on the CCD. Next to the cold CCD inside the horizontal dewar is a calibrated reference photodiode which is regulated to the PD calibration temperature, 25° C. The ratio of the CCD and in-dewar reference PD signals provides the QE measurement. Additional cross-calibration to a PD on the integrating sphere permits lower-intensity exposures.

Paper Details

Date Published: 6 February 2006
PDF: 11 pages
Proc. SPIE 6068, Sensors, Cameras, and Systems for Scientific/Industrial Applications VII, 60680F (6 February 2006); doi: 10.1117/12.667313
Show Author Affiliations
Donald E. Groom, Lawrence Berkeley National Lab. (United States)
Christopher J. Bebek, Lawrence Berkeley National Lab. (United States)
Maximilian Fabricius, Lawrence Berkeley National Lab. (United States)
Armin Karcher, Lawrence Berkeley National Lab. (United States)
William F. Kolbe, Lawrence Berkeley National Lab. (United States)
Natalie A. Roe, Lawrence Berkeley National Lab. (United States)
Jens Steckert, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 6068:
Sensors, Cameras, and Systems for Scientific/Industrial Applications VII
Morley M. Blouke, Editor(s)

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