Share Email Print

Proceedings Paper

Sb-heterostructure diode detector W-band NEP and NEDT optimization
Author(s): H. P. Moyer; R. L. Bowen; J. N. Schulman; D. H. Chow; S. Thomas; T. Y. Hsu; J. J. Lynch; K. S. Holabird
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Sb-heterostructure diodes have become the detector of choice for W-band millimeter wave imaging cameras now being commercialized or in prototype development. Here we optimize the diode impedance to yield a minimum noise equivalent power (NEP). The goal is to decrease the gain required of the front-end LNA. Measured W-band sensitivities for two diodes are 3500 and 5500V/W. Their zero bias differential resistance values imply Johnson noise limited NEP's of 0.98 and 0.83pW/Hz1/2, respectively, much less than obtained from conventional biased Schottky diodes. A MMIC version of the diode detector has been simulated with an integrated bandwidth of ~ 30 GHz at W-band. The simulated temperature sensitivity (NEΔT) with an HRL W-band LNA on the front end is <1°K.

Paper Details

Date Published: 5 May 2006
PDF: 7 pages
Proc. SPIE 6211, Passive Millimeter-Wave Imaging Technology IX, 62110J (5 May 2006); doi: 10.1117/12.667284
Show Author Affiliations
H. P. Moyer, HRL Labs LLC (United States)
R. L. Bowen, HRL Labs LLC (United States)
J. N. Schulman, HRL Labs LLC (United States)
D. H. Chow, HRL Labs LLC (United States)
S. Thomas, HRL Labs LLC (United States)
T. Y. Hsu, HRL Labs LLC (United States)
J. J. Lynch, HRL Labs LLC (United States)
K. S. Holabird, HRL Labs LLC (United States)

Published in SPIE Proceedings Vol. 6211:
Passive Millimeter-Wave Imaging Technology IX
Roger Appleby; David A. Wikner, Editor(s)

© SPIE. Terms of Use
Back to Top