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Proceedings Paper

A new instrument for fiber connector endface measurement
Author(s): Zongtao Ge; Fumio Kobayashi
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Paper Abstract

A new instrument for measuring end surface geometrical parameters of APC connectors is described. In this apparatus, a Mirau type interferometric objective is employed to measure a small area of the connector end surface and generate interferogram corresponding to the surface profile. Various new technologies are used to ensure high performance and high measurement repeatability. A multi-point method is proposed to adjust the inclination of the PC sample stage. APC angle of the sample stage is adjusted directly on the instrument using a special tool whose angle is calibrated by using the reversal method. Measurement results of important parameters of fiber connector end faces are compared with those inspected by commercial profiler or a standard sample. Optical insertion losses of connectors inspected by the developed system are also evaluated.

Paper Details

Date Published: 9 December 2005
PDF: 10 pages
Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 602425 (9 December 2005); doi: 10.1117/12.666950
Show Author Affiliations
Zongtao Ge, Fujinon Corp. (Japan)
Fumio Kobayashi, Fujinon Corp. (Japan)


Published in SPIE Proceedings Vol. 6024:
ICO20: Optical Devices and Instruments
James C. Wyant; X. J. Zhang, Editor(s)

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