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Proceedings Paper

Optoelectronic non-contact measuring method for the taper of a bore
Author(s): Liancun Zhang; Qingyuan Tian; Xun Zhou; Libao Yang; Yang Fang; Guoyu Zhang; Xiping Xu
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Paper Abstract

Based on laser optical triangulation displacement and grating displacement inspecting principle, optoelectronic non-contact inspecting method and inspecting system for the taper of small-calibre bore are presented. In this paper, the constitute and overall structure of the system are described. Then, the taper inspecting method and principle of the bore are discussed and theoretically analyzed, and also, the corresponding mathematics model is established. As inner diameter measurement is an important parameter for the taper of small-bore, an inner diameter laser non-contact measuring method is presented based on the structure characteristic of the taper of small-calibre bore, which adopted optoelectronic probe sensitive device (PSD) and laser optical triangulation inspecting principle. And then, the laser probe inner diameter measuring system is designed based them. Moreover, the measuring principle, the project of optical system of this measuring system are illuminated in detail in this article. The accuracy of inspecting system is verified by experiment. The results showed that the measuring error of inspecting system is superior to ±0.005, and the inspecting repetition is superior to ±0.003. It indicates that the system can fulfill the inspecting accuracy demand for inspecting the taper of the small-calibre bore, and the inspecting method is applicable.

Paper Details

Date Published: 9 December 2005
PDF: 5 pages
Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 60241D (9 December 2005); doi: 10.1117/12.666858
Show Author Affiliations
Liancun Zhang, The . (China)
Qingyuan Tian, Jimei Univ. (China)
Xun Zhou, The Institute of Armored Forces Technology (China)
Changchun Univ. of Science and Technology (China)
Libao Yang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yang Fang, Changchun Univ. of Science and Technology (China)
Guoyu Zhang, Changchun Univ. of Science and Technology (China)
Xiping Xu, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6024:
ICO20: Optical Devices and Instruments
James C. Wyant; X. J. Zhang, Editor(s)

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