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Proceedings Paper

A novel method for measuring the thickness of optical wave plate
Author(s): Weiwei Feng; Lihuang Lin
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Paper Abstract

Based on chromatic polarization interferometry, a novel method for measuring the thickness of optical wave plate is presented. When the resolution power of spectrometer reaches 0.01nm, the measuring precision of the thickness is better than 0.1μm.

Paper Details

Date Published: 9 December 2005
PDF: 7 pages
Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 60241B (9 December 2005); doi: 10.1117/12.666856
Show Author Affiliations
Weiwei Feng, Shanghai Institute of Optics and Fine Mechanics (China)
Lihuang Lin, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 6024:
ICO20: Optical Devices and Instruments
James C. Wyant; X. J. Zhang, Editor(s)

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