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Proceedings Paper

An optical measuring method of high temperature clinker layer's thickness
Author(s): Chengbo Zheng; Bin Liu; Zuojun Wang; Hongtao Yan; Wei Zhu; Shike Zheng
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Paper Abstract

In this paper, we present a method based on CCD offering the advantages of high sensitivity, no electromagnetic interference and non-contact in order to measure the thickness of the cooler precisely in high temperature and dust atrocious condition online with real-time and reliable parameter for the control system. By analyzing the principle of CCD and the histogram on the grey scale distribution on the layer's image, the thickness measuring model based on the image segmentation method is founded. According to the image characters of clinker layer, both image segmentation and filtering methods before or after the segmentation are selected. The camera cooling system is designed particularly considering the situation where the camera and the clinker cooler work. After analyzing the shortcomings of the measuring method, an improved one named stereopsis thickness measuring method is present, by means of firstly setting up the stereopsis thickness measuring model before determining the homonymic dots recognizing model, then to abstract the characteristic vector to analyze the recognizing method to establish the precise analyzing model, and finally to complete the experimental research of the thickness measurement based on the image segmentation in order to test the feasibility and to show the results to all.

Paper Details

Date Published: 9 December 2005
PDF: 6 pages
Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 60240U (9 December 2005); doi: 10.1117/12.666836
Show Author Affiliations
Chengbo Zheng, Yanshan Univ. (China)
Bin Liu, Yanshan Univ. (China)
Zuojun Wang, Yanshan Univ. (China)
Hongtao Yan, Yanshan Univ. (China)
Wei Zhu, Yanshan Univ. (China)
Shike Zheng, Yanshan Univ. (China)


Published in SPIE Proceedings Vol. 6024:
ICO20: Optical Devices and Instruments
James C. Wyant; X. J. Zhang, Editor(s)

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