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Proceedings Paper

Evaluation and display of polarimetric image data using long-wave cooled microgrid focal plane arrays
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Paper Abstract

Recent developments for Long Wave InfraRed (LWIR) imaging polarimeters include incorporating a microgrid polarizer array onto the focal plane array (FPA). Inherent advantages over typical polarimeters include packaging and instantaneous acquisition of thermal and polarimetric information. This allows for real time video of thermal and polarimetric products. The microgrid approach has inherent polarization measurement error due to the spatial sampling of a non-uniform scene, residual pixel to pixel variations in the gain corrected responsivity and in the noise equivalent input (NEI), and variations in the pixel to pixel micro-polarizer performance. The Degree of Linear Polarization (DoLP) is highly sensitive to these parameters and is consequently used as a metric to explore instrument sensitivities. Image processing and fusion techniques are used to take advantage of the inherent thermal and polarimetric sensing capability of this FPA, providing additional scene information in real time. Optimal operating conditions are employed to improve FPA uniformity and sensitivity. Data from two DRS Infrared Technologies, L.P. (DRS) microgrid polarizer HgCdTe FPAs are presented. One FPA resides in a liquid nitrogen (LN2) pour filled dewar with a 80°K nominal operating temperature. The other FPA resides in a cryogenic (cryo) dewar with a 60° K nominal operating temperature.

Paper Details

Date Published: 3 May 2006
PDF: 10 pages
Proc. SPIE 6240, Polarization: Measurement, Analysis, and Remote Sensing VII, 62400F (3 May 2006); doi: 10.1117/12.666600
Show Author Affiliations
David L. Bowers, Applied Technology Associates (United States)
James K. Boger, Applied Technology Associates (United States)
L. David Wellems, Applied Technology Associates (United States)
Wiley T. Black, Applied Technology Associates (United States)
Steve E. Ortega, Applied Technology Associates (United States)
Bradley M. Ratliff, Applied Technology Associates (United States)
Matthew P. Fetrow, Air Force Research Lab. (United States)
John E. Hubbs, Air Force Research Lab. (United States)
Ball Aerospace & Technologies Corp. (United States)
J. Scott Tyo, Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 6240:
Polarization: Measurement, Analysis, and Remote Sensing VII
Dennis H. Goldstein; David B. Chenault, Editor(s)

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