Share Email Print

Proceedings Paper

Evaluation testbed for ATD performance prediction (ETAPP)
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Automatic target detection (ATD) systems process imagery to detect and locate targets in imagery in support of a variety of military missions. Accurate prediction of ATD performance would assist in system design and trade studies, collection management, and mission planning. A need exists for ATD performance prediction based exclusively on information available from the imagery and its associated metadata. We present a predictor based on image measures quantifying the intrinsic ATD difficulty on an image. The modeling effort consists of two phases: a learning phase, where image measures are computed for a set of test images, the ATD performance is measured, and a prediction model is developed; and a second phase to test and validate performance prediction. The learning phase produces a mapping, valid across various ATR algorithms, which is even applicable when no image truth is available (e.g., when evaluating denied area imagery). The testbed has plug-in capability to allow rapid evaluation of new ATR algorithms. The image measures employed in the model include: statistics derived from a constant false alarm rate (CFAR) processor, the Power Spectrum Signature, and others. We present a performance predictor using a trained classifier ATD that was constructed using GENIE, a tool developed at Los Alamos National Laboratory. The paper concludes with a discussion of future research.

Paper Details

Date Published: 18 May 2006
PDF: 12 pages
Proc. SPIE 6234, Automatic Target Recognition XVI, 623413 (18 May 2006); doi: 10.1117/12.666365
Show Author Affiliations
Scott K. Ralph, Charles River Analytics, Inc. (United States)
Mark R. Stevens, Charles River Analytics, Inc. (United States)
Magnús Snorrason, Charles River Analytics, Inc. (United States)
John Irvine, Science Applications International Corp. (United States)
David Vanstone, AMRDEC, Redstone Arsenal (United States)

Published in SPIE Proceedings Vol. 6234:
Automatic Target Recognition XVI
Firooz A. Sadjadi, Editor(s)

© SPIE. Terms of Use
Back to Top