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Proceedings Paper

Estimating the refractive index and reflected zenith angle of a target using multiple polarization measurements
Author(s): Vimal Thilak; David Voelz; Charles Creusere; Srikanth Damarla
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Paper Abstract

A passive polarization based imaging system records the polarization state of light reflected by objects that are illuminated with an unpolarized and generally uncontrolled source. The information conveyed by the polarization state of light has been exploited in applications such as target detection, shape extraction and material classification. In this paper we present a method to jointly estimate the refractive index and the reflected zenith angle from two measurements collected by a passive polarimeter. An expression for the degree of polarization is derived from the microfacet polarimetric bidirectional reflectance model for the case of scattering in the place of incidence. The parameters of interest are iteratively estimated from polarization measurements assumed to be collected with a polarimeter. Computer simulations are presented to demonstrate the effectiveness of the proposed method.

Paper Details

Date Published: 3 May 2006
PDF: 8 pages
Proc. SPIE 6240, Polarization: Measurement, Analysis, and Remote Sensing VII, 624004 (3 May 2006); doi: 10.1117/12.666183
Show Author Affiliations
Vimal Thilak, New Mexico State Univ. (United States)
David Voelz, New Mexico State Univ. (United States)
Charles Creusere, New Mexico State Univ. (United States)
Srikanth Damarla, New Mexico State Univ. (United States)


Published in SPIE Proceedings Vol. 6240:
Polarization: Measurement, Analysis, and Remote Sensing VII
Dennis H. Goldstein; David B. Chenault, Editor(s)

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