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Proceedings Paper

FNIT: the fast neutron imaging telescope for SNM detection
Author(s): Ulisse Bravar; Paul J. Bruillard; Erwin O. Flückiger; John R. Macri; Mark L. McConnell; Michael R. Moser; James M. Ryan
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Paper Abstract

We report on recent progress in the development of the Fast Neutron Imaging Telescope (FNIT), a detector with both imaging and energy measurement capabilities, sensitive to neutrons in the 2-20 MeV range. FNIT was initially conceived to study solar neutrons as a candidate design for the Solar Sentinels program under formulation at NASA. This instrument is now being configured to locate fission neutron sources for homeland security purposes. By accurately identifying the position of the neutron source with imaging techniques and reconstructing the energy spectrum of fission neutrons, FNIT can locate problematic amounts of Special Nuclear Material (SNM), including heavily shielded and masked samples. The detection principle is based on multiple elastic neutron-proton (n-p) scatterings in organic scintillators. By reconstructing the n-p event locations and sequence and measuring the recoil proton energies, the direction and energy spectrum of the primary neutron flux can be determined and neutron point sources identified. The performance of FNIT is being evaluated through a series of Monte Carlo simulations and lab tests of detector prototypes. The Science Model One (SM1) of this instrument was recently assembled and is presently undergoing performance testing.

Paper Details

Date Published: 30 May 2006
PDF: 9 pages
Proc. SPIE 6213, Non-Intrusive Inspection Technologies, 62130G (30 May 2006); doi: 10.1117/12.666119
Show Author Affiliations
Ulisse Bravar, Univ. of New Hampshire (United States)
Paul J. Bruillard, Univ. of New Hampshire (United States)
Erwin O. Flückiger, Univ. of Bern (Switzerland)
John R. Macri, Univ. of New Hampshire (United States)
Mark L. McConnell, Univ. of New Hampshire (United States)
Michael R. Moser, Univ. of Bern (Switzerland)
James M. Ryan, Univ. of New Hampshire (United States)

Published in SPIE Proceedings Vol. 6213:
Non-Intrusive Inspection Technologies
George Vourvopoulos; F. Patrick Doty, Editor(s)

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