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Proceedings Paper

Effective protective surveillance for waterside-located chemical plants
Author(s): John Love; Doug Van Dover
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Paper Abstract

Millions of citizens live and work in the dangerous proximity of chemical plants, at ports and along waterways, which are under-protected and whose security is under-regulated, according to findings of the Congressional Research Service (CRS). There is a new and intense focus on the security of the nation's critical infrastructure. Thanks to recent philosophy and policy shifts within our federal government, the alarming situations in which we find ourselves will be mitigated somewhat a) by setting priorities based on proper threat analysis that considers event likelihoods and consequential impacts, and b) by employing effective systems design and engineering that will make it possible to address the highest priority threats with affordable solutions. It is the latter concern that we address, especially as it is relates to design and engineering of solutions for maintaining vigilance night and day. We begin by reviewing the nature of the facilities we wish to protect, our assumptions, and an accepted framework for analysis. Next we outline a hypothetical design case involving a representative facility and a plausible design basis threat. We then derive requirements for surveillance and examine the interrelationships among key design variables. Finally, we describe a solution involving multiple sensor types coupled with intelligent video. The end result is a significant increase in interdiction probability with a minimum of required assets.

Paper Details

Date Published: 12 May 2006
PDF: 11 pages
Proc. SPIE 6204, Photonics for Port and Harbor Security II, 62040C (12 May 2006); doi: 10.1117/12.665993
Show Author Affiliations
John Love, Night Vision Equipment Co. (United States)
Doug Van Dover, Night Vision Equipment Co. (United States)


Published in SPIE Proceedings Vol. 6204:
Photonics for Port and Harbor Security II
Michael J. DeWeert; Theodore T. Saito; Harry L. Guthmuller, Editor(s)

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