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Proceedings Paper

Image smear noise in CCDs
Author(s): David Down
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Paper Abstract

This paper develops equations for the bias and random noise in the signal estimates from both non-frame transfer CCDs and frame transfer CCDs having overclock rows that are used to estimate and eliminate the bias due to image smear. The paper also reports on numerical experiment estimates of signal, bias, and random noise obtained from computer simulation of the charge generation, charge transfer, and signal processing steps employed with these CCDs to obtain signal estimates. The theoretical predictions of the exact equations are checked against the experimental results of the simulation and found to be in close agreement. Using the analytical formula, the magnitude of the smear bias in the signal estimate for a non frame transfer CCD is compared to the magnitude of the true minimum signal for CCD operating parameters similar to the ones in a unique Earth remote sensing application. The bias error due to smear is found to be huge, 1.3 times the magnitude of the true signal. For the same operating conditions, the total random noises are compared for this CCD and one having overclock rows to eliminate bias. The random noise of the frame transfer CCD with overclock rows is only 1 electron greater than the random noise of the non frame transfer CCD. Thus, using the frame transfer CCD with overclock rows to eliminate bias, the additional random noise error incurred is minimal compared to the error from the eliminated bias.

Paper Details

Date Published: 19 May 2006
PDF: 38 pages
Proc. SPIE 6220, Spaceborne Sensors III, 622002 (19 May 2006); doi: 10.1117/12.665954
Show Author Affiliations
David Down, Ball Aerospace & Technologies Corp. (United States)

Published in SPIE Proceedings Vol. 6220:
Spaceborne Sensors III
Richard T. Howard; Robert D. Richards, Editor(s)

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