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Proceedings Paper

All-glass broadband VIS-NIR linear polarizer for specialized applications
Author(s): Rachid Gafsi; Katherine R. Rossington; Peter A. Schrauth
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Paper Abstract

In this paper, the processes and results will be presented for all glass polarizer covering the wavelength range of visible (VIS) to the near Infra-Red (IR) band. Currently, Corning Incorporated manufactures and commercializes several polarizers for nominal wavelengths ranging from 633 nm to 2100 nm. For each of these polarizers, the polarization bandwidth is about 80 nm, except for Polarcor W I D E Band product, which has a polarization bandwidth of 370 nm. The all-glass absorptive polarizer discussed in this paper has a polarization bandwidth of at least 400 nm and high Polarization Extinction Ratio (PER) over the bandwidth 600 nm to 1100 nm. The polarizer is monolithic, hence free of epoxy or optical cement. The polarizer spectrum of PER and % transmission without anti-reflection coating will be presented and discussed. This new polarizer offers excellent optical properties, as well as high durability and consistency, which will offer several advantages and benefits when it is deployed in optical components, devices and systems. The applications for this polarizer may include: polarization dependent optical isolators, polarimetry systems, ellipsometers, electro-optics and liquid crystal modulators, and many other polarization based devices and systems. The new polarizer can be used in specialized governmental applications where Polarcor glass polarizers are presently used.

Paper Details

Date Published: 3 May 2006
PDF: 5 pages
Proc. SPIE 6240, Polarization: Measurement, Analysis, and Remote Sensing VII, 62400K (3 May 2006); doi: 10.1117/12.665861
Show Author Affiliations
Rachid Gafsi, Corning Inc. (United States)
Katherine R. Rossington, Corning Inc. (United States)
Peter A. Schrauth, Corning Inc. (United States)


Published in SPIE Proceedings Vol. 6240:
Polarization: Measurement, Analysis, and Remote Sensing VII
Dennis H. Goldstein; David B. Chenault, Editor(s)

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