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Proceedings Paper

Material classification based on multi-band polarimetric images fusion
Author(s): Yongqiang Zhao; Quan Pan; Hongcai Zhang
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Paper Abstract

Polarization imparted by surface reflections contains unique and discriminatory signatures which may augment spectral target-detection techniques. With the development of multi-band polarization imaging technology, it is becoming more and more important on how to integrate polarimetric, spatial and spectral information to improve target discrimination. In this study, investigations were performed on combining multi-band polarimetric images through false color mapping and wavelet integrated image fusion method. The objective of this effort was to extend the investigation of the use of polarized light to target detection and material classification. As there is great variation in polarization in and between each of the bandpasses, and this variation is comparable to the magnitude of the variation intensity. At the same time, the contrast in polarization is greater than for intensity, and that polarization contrast increases as intensity contrast decreases. It is also pointed out that chromaticity can be used to make targets stand out more clearly against background, and material can be divided into conductor and nonconductor through polarization information. So, through false color mapping, the difference part of polarimetric information between each of the bandpasses and common part of polarimetric information in each of the bandpasses are combined, in the resulting image the conductor and nonconductor are assigned different color. Then panchromatic polarimetric images are fused with resulting image through wavelet decomposition, the final fused image have more detail information and more easy identification. This study demonstrated, using digital image data collected by imaging spectropolarimeter, multi-band imaging polarimetry is likely to provide an advantage in target detection and material classification.

Paper Details

Date Published: 3 May 2006
PDF: 8 pages
Proc. SPIE 6240, Polarization: Measurement, Analysis, and Remote Sensing VII, 624007 (3 May 2006); doi: 10.1117/12.665456
Show Author Affiliations
Yongqiang Zhao, Northwestern Polytechnical Univ. (China)
Quan Pan, Northwestern Polytechnical Univ. (China)
Hongcai Zhang, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 6240:
Polarization: Measurement, Analysis, and Remote Sensing VII
Dennis H. Goldstein; David B. Chenault, Editor(s)

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