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Proceedings Paper

Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions
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Paper Abstract

We apply the self-mixing method for the measurement of the linewidth enhancement factor of several types of semiconductor lasers. The α-factor value above threshold is determined by analysing the small perturbations that occur to the laser when it is subjected to moderate optical feedback, relying on the well-known Lang-Kobayashi equations. The method is applied to Fabry-Perot, VCSEL, External Cavity Laser (ECL), DFB, Quantum Cascade Laser. It is found that for some lasers the α-factor varies with the emitted power, and these variations can be correlated with variations in the laser linewidth.

Paper Details

Date Published: 14 April 2006
PDF: 9 pages
Proc. SPIE 6184, Semiconductor Lasers and Laser Dynamics II, 61841D (14 April 2006); doi: 10.1117/12.665178
Show Author Affiliations
Guido Giuliani, Univ. di Pavia (Italy)
Silvano Donati, Univ. di Pavia (Italy)
Wolfgang Elsässer, Technische Univ. Darmstadt (Germany)


Published in SPIE Proceedings Vol. 6184:
Semiconductor Lasers and Laser Dynamics II
Daan Lenstra; Markus Pessa; Ian H. White, Editor(s)

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