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Proceedings Paper

Recycling losses and tapered lineic microcavities on SOI
Author(s): P. Velha; J. C. Rodier; P. Lalanne; D. Peyrade; E. Picard; T. Charvolin; E. Hadji
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Paper Abstract

Short microcavities consisting of two identical tapered hole mirrors etched into silicon-on-insulator ridge waveguides are investigated. They are designed for operating at telecom wavelength. We describe theoretically and experimentally two different ways to boost quality factors to some thousands. In one hand, we investigate the adaptation of mode profile to suppress mismatch losses. In an other hand, we explore the recycling of the losses. We obtained quality factor up to 3000, which opens the route to WDM applications.

Paper Details

Date Published: 20 April 2006
PDF: 11 pages
Proc. SPIE 6195, Nanophotonics, 61951S (20 April 2006); doi: 10.1117/12.664506
Show Author Affiliations
P. Velha, Lab. Charles Fabry de l'Institut d'Optique, CNRS, Univ. Paris XI (France)
Lab. des Technologies de la microélectronique (France)
Lab. Silicium Nanoélectronique Photonique et Structure, CEA (France)
J. C. Rodier, Lab. Charles Fabry de l'Institut d'Optique, CNRS, Univ. Paris XI (France)
P. Lalanne, Lab. Charles Fabry de l'Institut d'Optique, CNRS, Univ. Paris XI (France)
D. Peyrade, Lab. des Technologies de la microélectronique (France)
E. Picard, Lab. Silicium Nanoélectronique Photonique et Structure, CEA (France)
T. Charvolin, Lab. Silicium Nanoélectronique Photonique et Structure, CEA (France)
E. Hadji, Lab. Silicium Nanoélectronique Photonique et Structure, CEA (France)


Published in SPIE Proceedings Vol. 6195:
Nanophotonics
David L. Andrews; Jean-Michel Nunzi; Andreas Ostendorf, Editor(s)

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