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Proceedings Paper

The board implementation of AVR microcontroller checking for single event upsets
Author(s): Young Hwan Lho; Dae Jin Jang; Kang Kuk Seo; Jae Ho Jung; Ki Yup Kim
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Paper Abstract

Radiation hardening parts are to be used for satellites and nuclear power plants due to various kinds of radiation particles in space and radiation environment. Here, our focus is to implement a testing board of AVR Microcontroller checking for Single Event Upsets (SEU); the effects of protons on the electronic devices. The SEU results form the level change of stored information due to photon radiation and temperature in the space environment. The impact of SEU on PLD (Programmable Logic Devices) technology is most apparent in SRAM/ROM/DRAM devices wherein the state of storage cell can be upset. In this research, a simple and powerful test technique is suggested, and the results are presented for the analysis and future reference. In our experiment, the proton radiation facility (having the energy of 30 MeV with a beam current of 20 uA in the cyclotron) available at KIRAMS (Korea Institute of Radiological Medical Sciences) has been applied on two kinds of commercially available SRAM and EEPROM.

Paper Details

Date Published: 21 March 2006
PDF: 6 pages
Proc. SPIE 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials, 60401I (21 March 2006); doi: 10.1117/12.664224
Show Author Affiliations
Young Hwan Lho, Woosong Univ. (South Korea)
Dae Jin Jang, Woosong Univ. (South Korea)
Kang Kuk Seo, Woosong Univ. (South Korea)
Jae Ho Jung, Woosong Univ. (South Korea)
Ki Yup Kim, Korea Atomic Energy Institute (South Korea)


Published in SPIE Proceedings Vol. 6040:
ICMIT 2005: Mechatronics, MEMS, and Smart Materials
Yunlong Wei; Kil To Chong; Takayuki Takahashi; Shengping Liu; Zushu Li; Zhongwei Jiang; Jin Young Choi, Editor(s)

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