Share Email Print

Proceedings Paper

Finite element analysis of tip-enhanced Raman scattering
Author(s): Andrew Downes; Donald Salter; Alistair Elfick
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have performed Finite Element Electromagnetic modeling of light scattering in 'apertureless' Scanning Probe Optical Microscopy. Metal tips above metallic and transparent surfaces were modeled to determine suitable conditions for Tip-Enhanced Raman Spectroscopy (TERS) and fluorescence. Gold, silicon, and oxidized silicon were evaluated as potential tip materials, as were the widely used flat substrates of gold, mica and silicon. The lateral resolution of optical imaging is calculated, as a function of tip-substrate separation. This resolution can be made significantly smaller than the tip radius for small tip-substrate separations. In order to model biologically relevant samples, aqueous environments are investigated for the first time, yielding some surprising results.

Paper Details

Date Published: 20 April 2006
PDF: 13 pages
Proc. SPIE 6195, Nanophotonics, 61950D (20 April 2006); doi: 10.1117/12.664039
Show Author Affiliations
Andrew Downes, Univ. of Edinburgh (United Kingdom)
Donald Salter, Univ. of Edinburgh (United Kingdom)
Alistair Elfick, Univ. of Edinburgh (United Kingdom)

Published in SPIE Proceedings Vol. 6195:
David L. Andrews; Jean-Michel Nunzi; Andreas Ostendorf, Editor(s)

© SPIE. Terms of Use
Back to Top