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Proceedings Paper

Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals
Author(s): F. Pignatiello; M. De Rosa; P. Ferraro; A. Arie; S. Grilli; L. Sansone; S. De Nicola; P. De Natale
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Paper Abstract

We demonstrate a dual interferometric technique for simultaneous and independent measurements of the temperature dependence of the thermo-optic and thermal expansion coefficients in ferroelectric crystals. The crystal temperature can be changed from room temperature up to about 200°C by an actively stabilized heater (stability < 0.1°C). The thermal expansion coefficient is determined using a moire interferometer and monitoring the period of a grating written on the z-face of the crystal sample as a function of the temperature of the crystal. The thermo-optic coefficients of both ordinary and extraordinary axes are estimated by measuring the optical path variation measured by a Mach-Zehnder interferometer with one arm passing through the crystal perpendicularly to the crystal z-axis. This method can be applied to a wide variety of optical materials, when an accurate knowledge of the temperature dependence of the refractive index and thermal expansion is needed.

Paper Details

Date Published: 28 April 2006
PDF: 9 pages
Proc. SPIE 6188, Optical Micro- and Nanometrology in Microsystems Technology, 61880O (28 April 2006); doi: 10.1117/12.664037
Show Author Affiliations
F. Pignatiello, CNR, Istituto Nazionale di Ottica Applicata (Italy)
M. De Rosa, CNR, Istituto Nazionale di Ottica Applicata (Italy)
P. Ferraro, CNR, Istituto Nazionale di Ottica Applicata (Italy)
A. Arie, Tel-Aviv Univ. (Israel)
S. Grilli, CNR, Istituto Nazionale di Ottica Applicata (Italy)
L. Sansone, CNR, Istituto Nazionale di Ottica Applicata (Italy)
S. De Nicola, CNR, Istituto di Cibernetica (Italy)
P. De Natale, CNR, Istituto Nazionale di Ottica Applicata (Italy)


Published in SPIE Proceedings Vol. 6188:
Optical Micro- and Nanometrology in Microsystems Technology
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

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