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Proceedings Paper

The seeker experimental system at MIT Lincoln Laboratory
Author(s): Alexander G. Hayes; George Downs; Anthony Gabrielson; David C. Harrison; Eric L. Hines; Leaf A. Jiang; Jonathan M. Richardson; Jonathan Swenson
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Paper Abstract

The Seeker Experimental System (SES) is the passive range within MIT Lincoln Laboratory's Optical System Test Facility (OSTF). The SES laboratory focuses on the characterization of passive infrared sensors. Capable of projecting static and dynamic scenes in both cryogenic and room temperature environments, SES supports sensors that range from tactical ground based systems through strategic space-based architectures. Optical infrared sensors are a major component of military systems, having been used to acquire, track, and discriminate between potential targets and improve our understanding of the physics and phenomenology of objects. This paper delineates the capabilities of the SES laboratory and describes how they are used to characterize infrared sensors and develop new algorithms and hardware in the support of future sensor technology. The SES Cryogenic Scene Projection System vacuum chamber has recently been upgraded to allow dynamic projection of radiometrically accurate two-color infrared imagery. Additional capabilities include the ability to combine imagery from multiple sources, NIST traceable radiometric calibration, and dynamic scene projection in an ambient environment using a combination of high speed mirrors, point source blackbodies, and resistive array based dynamic infrared scene projectors.

Paper Details

Date Published: 16 May 2006
PDF: 11 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 620809 (16 May 2006); doi: 10.1117/12.663801
Show Author Affiliations
Alexander G. Hayes, MIT Lincoln Lab (United States)
George Downs, MIT Lincoln Lab (United States)
Anthony Gabrielson, MIT Lincoln Lab (United States)
David C. Harrison, MIT Lincoln Lab (United States)
Eric L. Hines, MIT Lincoln Lab (United States)
Leaf A. Jiang, MIT Lincoln Lab (United States)
Jonathan M. Richardson, MIT Lincoln Lab (United States)
Jonathan Swenson, MIT Lincoln Lab (United States)

Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer, Editor(s)

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