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Proceedings Paper

Degradation of organic light-emitting diode
Author(s): S. Caria; R. Zamboni; M. Murgia; P. Melpignano; V. Biondo; L. Aballe; A. Barinov; S. Gardonio; L. Gregoratti; M. Kiskinova
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Paper Abstract

Ultra high vacuum operated prototypical organic light emitting diodes have been investigated by using chemically sensitive x-ray photoelectron microscopy. The mechanism of dark spot formation and degradation of organic light emitting devices have been imaged and spectroscopically measured. The morphology and the chemical composition of the Al cathode reveal the formation of volcano like defects as a result of local micro-explosions. The chemical maps and micro-spot spectra identify a release of volatile In-, Sn- and C-containing species, including metallic In, supporting the evidence that the degradation process is driven by local decomposition of the ITO/organic interface.

Paper Details

Date Published: 26 April 2006
PDF: 7 pages
Proc. SPIE 6192, Organic Optoelectronics and Photonics II, 61922D (26 April 2006); doi: 10.1117/12.663649
Show Author Affiliations
S. Caria, Istituto per lo Studio dei Materiali Nanostrutturati, CNR (Italy)
R. Zamboni, Istituto per lo Studio dei Materiali Nanostrutturati, CNR (Italy)
M. Murgia, Istituto per lo Studio dei Materiali Nanostrutturati, CNR (Italy)
P. Melpignano, Ctr. Ricerche Plast-Optica (Italy)
V. Biondo, Ctr. Ricerche Plast-Optica (Italy)
L. Aballe, Sincrotrone Trieste (Italy)
A. Barinov, Sincrotrone Trieste (Italy)
S. Gardonio, Sincrotrone Trieste (Italy)
L. Gregoratti, Sincrotrone Trieste (Italy)
M. Kiskinova, Sincrotrone Trieste (Italy)


Published in SPIE Proceedings Vol. 6192:
Organic Optoelectronics and Photonics II
Paul L. Heremans; Michele Muccini; Eric A. Meulenkamp, Editor(s)

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