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Proceedings Paper

Performance and reliability predictions of 1550 nm WDM optical transmission links using a system simulator
Author(s): L. Bechou; L. Mendizabal; C. Aupetit-Berthelemot; Y. Deshayes; J. M. Dumas; D. Laffitte; J. L. Goudard; Y. Danto
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Paper Abstract

This paper reports simulation results of transmission performances after introduction of DFB laser diode parameters variations versus time extrapolated from accelerated tests. Simulations are performed using a system simulator to study the consequence of degradations of the laser diode on system performances (eye diagram, quality factor - Q and binary error rate - BER). The studied link consists in 4x2.5 Gbits/s WDM channels with direct modulation and equally spaced by 0,8 nm around the 1550 nm central wavelength. In this paper, only one channel is assumed to be degraded considering an only one activation energy. Simulation results clearly show that variation of basic parameters such as bias current or central wavelength induces a penalization of dynamic performances of the complete WDM link. Consequences on adjacent channels are pointed out underlying the relation between the variations of eye diagram parameters (height, noise, cross-talk, jitter) and the Q-factor decrease. Variations of optical spectrum density at the output of the demultiplexer are also analyzed showing penalties on the final cross-talk. Different degradation kinetics of aged laser diodes from a same batch have been also implemented to build the final distribution of Q-factor and BER after 25 years finally demonstrating the low impact of such variations. The strong interest of this approach is to evaluate the robustness of a dedicated-technology and to become a complementary tool of actual reliability-testing methods and physics of failure in the context of new reliability modeling approach. We have also highlighted the relevance of failure criteria established by actual qualification standards for high-rate optical telecommunication systems.

Paper Details

Date Published: 24 May 2006
PDF: 13 pages
Proc. SPIE 6193, Reliability of Optical Fiber Components, Devices, Systems, and Networks III, 619313 (24 May 2006); doi: 10.1117/12.663611
Show Author Affiliations
L. Bechou, Univ. Bordeaux 1 (France)
L. Mendizabal, Univ. Bordeaux 1 (France)
C. Aupetit-Berthelemot, Univ. of Limoges (France)
Y. Deshayes, Univ. Bordeaux 1 (France)
J. M. Dumas, Univ. of Limoges (France)
D. Laffitte, AVANEX-France (France)
J. L. Goudard, AVANEX-France (France)
Y. Danto, Univ. Bordeaux 1 (France)

Published in SPIE Proceedings Vol. 6193:
Reliability of Optical Fiber Components, Devices, Systems, and Networks III
Hans G. Limberger; M. John Matthewson, Editor(s)

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