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Proceedings Paper

Tomography using multiple wavelengths in digital holography: method, simulations, and experiments
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Paper Abstract

In this paper we present a method for tomographic imaging using multiple wavelengths in digital holographic microscopy. This method is based on the recording at different wavelengths equally separated in the k-domain, in off-axis geometry, of the interference between a reference wave and an object wave reflected by a microscopic sample and magnified by a microscope objective. A couple charged device (CCD) camera records consecutively the resulting holograms, which are then numerically reconstructed to obtain their resulting wavefront. Those wavefronts are then summed. The result of this operation is a constructive addition of complex waves in the selected plane and destructive addition in the others. Varying the plane of interest enables the scan the object in depth. For the presented simulations and experiments, twenty wavelengths are used in the 480-700 nm range. An object consisting of irregularly stairs with heights of 375, 525, 975, 1200 and 1275 nm is reconstructed. Its lateral dimensions are 250 × 250 microns. The results show clearly a 3D imaging technique with axial resolution under the micron.

Paper Details

Date Published: 25 April 2006
PDF: 10 pages
Proc. SPIE 6188, Optical Micro- and Nanometrology in Microsystems Technology, 618802 (25 April 2006); doi: 10.1117/12.663253
Show Author Affiliations
Frédéric Montfort, Lyncée Tec (Switzerland)
Florian Charrière, École Polytechnique Fédérale de Lausanne (Switzerland)
Tristan Colomb, École Polytechnique Fédérale de Lausanne (Switzerland)
Jonas Kuehn, École Polytechnique Fédérale de Lausanne (Switzerland)
Etienne Cuche, Lyncée Tec (Switzerland)
Christian Depeursinge, École Polytechnique Fédérale de Lausanne (Switzerland)


Published in SPIE Proceedings Vol. 6188:
Optical Micro- and Nanometrology in Microsystems Technology
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

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