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Proceedings Paper

Probing femtosecond plasmon dynamics with nanometer resolution
Author(s): Jörg Lange; Daniela Bayer; Martin Rohmer; Carsten Wiemann; Oksana Gaier; Martin Aeschlimann; Michael Bauer
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Paper Abstract

In combining time-resolved two-photon photoemission (TR-2PPE) and photoemission electron microscopy (PEEM) the ultrafast dynamics of collective electron excitations in silver nanoparticles (localized surface plasmons - LSP) is probed at femtosecond and nanometer resolution. In two examples we illustrate that a phase-resolved (interferometric) sampling of the LSP-dynamics enables detailed insight into dephasing and propagation processes associated with these excitations. For two close-lying silver nano-dots (diameter 200 nm) we are able to distinguish small particle to particle variations in the plasmon eigenfrequency, which typically give rise to inhomogeneous line-broadening of the plasmon resonance in lateral integrating frequency domain measurements. The observed spatio-temporal modulations in the photoemission yield from a single nanoparticle can be interpreted as local variation in the electric near-field and result from the phase propagation of the plasmon through the particle. Furthermore, we show that the control of the phase between the used femtosecond pump and probe laser pulses used for these experiments can be utilized for an external manipulation of the nanoscale electric near-field distribution at these particles.

Paper Details

Date Published: 20 April 2006
PDF: 9 pages
Proc. SPIE 6195, Nanophotonics, 61950Z (20 April 2006); doi: 10.1117/12.663097
Show Author Affiliations
Jörg Lange, Univ. of Kaiserslautern (Germany)
Daniela Bayer, Univ. of Kaiserslautern (Germany)
Martin Rohmer, Univ. of Kaiserslautern (Germany)
Carsten Wiemann, Univ. of Kaiserslautern (Germany)
Oksana Gaier, Univ. of Kaiserslautern (Germany)
Martin Aeschlimann, Univ. of Kaiserslautern (Germany)
Michael Bauer, Univ. of Kaiserslautern (Germany)


Published in SPIE Proceedings Vol. 6195:
Nanophotonics
David L. Andrews; Jean-Michel Nunzi; Andreas Ostendorf, Editor(s)

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