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Proceedings Paper

Tunable defects in colloidal photonic crystals
Author(s): Friederike Fleischhaker; André C. Arsenault; Nicolas Tétreault; Zhuo Wang; Vladimir Kitaev; Frank Peiris; Agustin Mihi; Hernan Miguez; Georg von Freymann; Ian Manners; Rudolf Zentel; Geoffrey A. Ozin
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Paper Abstract

We present a bottom-up approach for the construction of tunable functional defects in colloidal photonic crystals (CPCs). These structures incorporate polyelectrolyte multilayer (PEM) planar defects embedded in silica CPCs through a combination of evaporation induced self-assembly and microcontact transfer printing. We show how the enormous chemical diversity inherent to PEMs can be harnessed to create chemically active defect structures responsive to solvent vapor pressures, light, temperature as well as redox cycling. A sharp transmission state within the photonic stopband, induced by the PEM defect, can be precisely, reproducibly and in some cases reversibly tuned by these external stimuli. These materials could find numerous applications as optically monitored chemical sensors, adjustable notch filters and CPC-based tunable laser sources.

Paper Details

Date Published: 18 April 2006
PDF: 8 pages
Proc. SPIE 6182, Photonic Crystal Materials and Devices III (i.e. V), 61820L (18 April 2006); doi: 10.1117/12.662316
Show Author Affiliations
Friederike Fleischhaker, Univ. of Toronto (Canada)
Univ. of Mainz (Germany)
André C. Arsenault, Univ. of Toronto (Canada)
Nicolas Tétreault, Univ. of Toronto (Canada)
Zhuo Wang, Univ. of Toronto (Canada)
Vladimir Kitaev, Univ. of Toronto (Canada)
Frank Peiris, Univ. of Toronto (Canada)
Agustin Mihi, Instituto de Ciencia de Materiales de Sevilla (Spain)
Hernan Miguez, Instituto de Ciencia de Materiales de Sevilla (Spain)
Georg von Freymann, Univ. of Toronto (Canada)
Ian Manners, Univ. of Toronto (Canada)
Rudolf Zentel, Univ. of Mainz (Germany)
Geoffrey A. Ozin, Univ. of Toronto (Canada)


Published in SPIE Proceedings Vol. 6182:
Photonic Crystal Materials and Devices III (i.e. V)
Richard M. De La Rue; Pierre Viktorovitch; Ceferino Lopez; Michele Midrio, Editor(s)

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