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Proceedings Paper

Experimental characteristics and analysis of transverse modes in 1.3-µm strained InGaAs quantum well VCSELs
Author(s): E. Pougeoise; Ph. Gilet; Ph. Grosse; S. Poncet; A. Chelnokov; J.-M. Gérard; G. Bourgeois; R. Stevens; R. Hamelin; M. Hammar; J. Berggren; P. Sundgren; Sébastien Vilain; J.-S. Bouillard; G. Lerondel; R. Bachelot; P. Royer
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Paper Abstract

In the context of optical interconnection applications, we report on results obtained on strained InGaAs quantum well Vertical Cavity Surface Emitting Lasers (VCSELs). Our devices are top p-type DBR oxide-confined VCSEL, grown by metalorganic vapour-phase epitaxy (MOVPE). These lasers exhibit low threshold currents and deliver up to 1.77 mW in continuous wave operation at room temperature. Fundamental mode continuous-wave lasing at wavelengths beyond 1300 nm at room temperature is reached for a 4 μm oxide diameter VCSEL. The particular design of the active layer based on a large detuning between the gain maximum and the cavity resonance gives our devices a very specific thermal and modal behaviour. Therefore, we study the spectral and spatial distributions of the transverse modes by near field scanning optical microscopy using a micropolymer tip at the end of an optical fibre.

Paper Details

Date Published: 21 April 2006
PDF: 9 pages
Proc. SPIE 6185, Micro-Optics, VCSELs, and Photonic Interconnects II: Fabrication, Packaging, and Integration, 61850U (21 April 2006); doi: 10.1117/12.662118
Show Author Affiliations
E. Pougeoise, CEA-Grenoble, LETI (France)
Ph. Gilet, CEA-Grenoble, LETI (France)
Ph. Grosse, CEA-Grenoble, LETI (France)
S. Poncet, CEA-Grenoble, LETI (France)
A. Chelnokov, CEA-Grenoble, LETI (France)
J.-M. Gérard, CEA-Grenoble, DRFMC (France)
G. Bourgeois, IntexyS Photonics (France)
R. Stevens, IntexyS Photonics (France)
R. Hamelin, IntexyS Photonics (France)
M. Hammar, Royal Institute of Technology (Sweden)
J. Berggren, Royal Institute of Technology (Sweden)
P. Sundgren, Royal Institute of Technology (Sweden)
Sébastien Vilain, Lab. de Nanotechnologie et d'Instrumentation Optique, Univ. de Technologie de Troyes, CNRS (France)
J.-S. Bouillard, Lab. de Nanotechnologie et d'Instrumentation Optique, Univ. de Technologie de Troyes, CNRS (France)
G. Lerondel, Lab. de Nanotechnologie et d'Instrumentation Optique, Univ. de Technologie de Troyes, CNRS (France)
R. Bachelot, Lab. de Nanotechnologie et d'Instrumentation Optique, Univ. de Technologie de Troyes, CNRS (France)
P. Royer, Lab. de Nanotechnologie et d'Instrumentation Optique, Univ. de Technologie de Troyes, CNRS (France)


Published in SPIE Proceedings Vol. 6185:
Micro-Optics, VCSELs, and Photonic Interconnects II: Fabrication, Packaging, and Integration
Hugo Thienpont; Mohammad R. Taghizadeh; Peter Van Daele; Jürgen Mohr, Editor(s)

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