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Proceedings Paper

Investigation of polarization properties of VCSELs subject to optical feedback from an extremely short external cavity
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Paper Abstract

We numerically investigate how polarization properties of vertical cavity surface emitting lasers (VCSELs) are affected by optical feedback from an extremely short external cavity. In order to do it we use a two modes rate equation model that accounts for infinite round trips in the external cavity. With it we perform maps of bistability finding out a modulation of the polarization switching currents when increasing the external cavity length with a period equal to half the wavelength of operation of the device. When the external mirror reflectivity is high enough there is a region within each period of modulation where the VCSEL polarization is stable at any injected current within the operation range. Moreover, using polarized feedback the map of bistability is channelled and the bistable region is almost suppressed. A preliminar study of the effects of temperature variations on the map of bistability is also carried out and presents polarized feedback as a more robust technic to obtain polarization stabilization. An experimentally obtained map of bistability supports the model showing very good agreement with it.

Paper Details

Date Published: 21 April 2006
PDF: 9 pages
Proc. SPIE 6185, Micro-Optics, VCSELs, and Photonic Interconnects II: Fabrication, Packaging, and Integration, 61850Z (21 April 2006); doi: 10.1117/12.662081
Show Author Affiliations
Mikel Arizaleta Arteaga, Vrije Univ. Brussel (Belgium)
Univ. Pública de Navarra (Spain)
Heiko J. Unold, ETH Zürich (Switzerland)
Johannes M. Ostermann, Univ. of Ulm (Germany)
Rainer Michalzik, Univ. of Ulm (Germany)
Manuel López-Amo, Univ. Pública de Navarra (Spain)
Hugo Thienpont, Vrije Univ. Brussel (Belgium)
Krassimir Panajotov, Vrije Univ. Brussel (Belgium)
Institute of Solid State Physics (Bulgaria)


Published in SPIE Proceedings Vol. 6185:
Micro-Optics, VCSELs, and Photonic Interconnects II: Fabrication, Packaging, and Integration
Hugo Thienpont; Mohammad R. Taghizadeh; Peter Van Daele; Jürgen Mohr, Editor(s)

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