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Proceedings Paper

Reliability studies of micro-optical components in NEMO
Author(s): F. Berghmans; M. Van Uffelen; S. Eve; E. Ernst; A. Last; D. Rabus; N. Huber; O. Kraft; A. Andrei; L. Nieradko; K. Krupa; M. Jozwik; C. Gorecki; L. Hirsinger; P. Delobelle; P. Kniazewski; L. Salbut; M. Kujawinska
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Paper Abstract

We discuss on-going reliability studies of micro-optical components and assemblies as conducted in the EU FP6 Network of Excellence on Micro-Optics "NEMO". We focus on three case studies including first biaxial fatigue testing of micro-optical components, second reliability testing and quality control of MEMS and third micro-interferometric tomography for measuring optical fibre refractive index changes. For each of these case studies we discuss the dedicated measurement and characterization methods as well as first results and the perspectives for future research.

Paper Details

Date Published: 9 May 2006
PDF: 11 pages
Proc. SPIE 6193, Reliability of Optical Fiber Components, Devices, Systems, and Networks III, 61930A (9 May 2006); doi: 10.1117/12.662001
Show Author Affiliations
F. Berghmans, SCK-CEN (Belgium)
Vrije Univ. Brussel (Belgium)
M. Van Uffelen, SCK-CEN (Belgium)
S. Eve, IMF II, Forschungszentrum Karlsruhe GmbH (Germany)
E. Ernst, IMF II, Forschungszentrum Karlsruhe GmbH (Germany)
A. Last, IMT, Forschungszentrum Karlsruhe GmbH (Germany)
D. Rabus, IMT, Forschungszentrum Karlsruhe GmbH (Germany)
N. Huber, IMF II, Forschungszentrum Karlsruhe GmbH (Germany)
O. Kraft, IMF II, Forschungszentrum Karlsruhe GmbH (Germany)
A. Andrei, LOPMD, FEMTO-ST (France)
L. Nieradko, LOPMD, FEMTO-ST (France)
K. Krupa, LOPMD, FEMTO-ST (France)
M. Jozwik, LOPMD, FEMTO-ST (France)
C. Gorecki, LOPMD, FEMTO-ST (France)
L. Hirsinger, LMARC, FEMTO-ST (France)
P. Delobelle, LMARC, FEMTO-ST (France)
P. Kniazewski, Warsaw Univ. of Technology (Poland)
L. Salbut, Warsaw Univ. of Technology (Poland)
M. Kujawinska, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 6193:
Reliability of Optical Fiber Components, Devices, Systems, and Networks III
Hans G. Limberger; M. John Matthewson, Editor(s)

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