Share Email Print
cover

Proceedings Paper

Capabilities of a new spatiotemporal CMOS imager for nanosecond low power pulse detection
Author(s): Frédéric Morel; Chantal-Virginie Zint; Wilfried Uhring; Jean-Pierre Le Normand
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

High speed cameras use the interesting performances of CMOS imagers which offer advantages in on-chip functionalities, system power reduction, cost and miniaturization. The FAst MOS Imager (FAMOSI) project consists in reproducing the streak camera functionality with a CMOS imager. In this paper, we present a new imager called FAMOSI 2 which implements an electronic shutter and analog accumulation capabilities inside the pixel. With this kind of pixel and the new architecture for controlling the integration, FAMOSI 2 can work in repetitive mode for low light power and in single shot mode for higher light power. This repetitive mode utilizes an analog accumulation to improve the sensitivity of the system with a standard Nwell/Psub photodiode. The prototype has been fabricated in the AMS 0.35 μm CMOS process. The chip is composed of 64 columns per 64 rows of pixels. The pixels have a size of 20 μm per 20 μm and a fill factor of 47 %. Characterizations under static and uniform illumination in single shot mode have been done in order to evaluate the performances of the detector. The main noises levels have been evaluated and the experiments show that a conversion gain of 4.8 μV/e- is obtained with a dynamic range of 1.2 V. Moreover, the charge transfer characterization in single shot mode has been realized. It permits to know which potential must be apply to the charge spill transistor to obtain the whole dynamic of the output with a maximal transfer gain, what is primordial to optimize the analog accumulation.

Paper Details

Date Published: 25 April 2006
PDF: 12 pages
Proc. SPIE 6187, Photon Management II, 61871N (25 April 2006); doi: 10.1117/12.661996
Show Author Affiliations
Frédéric Morel, Institut d'Electronique du Solide et des Systèmes, CNRS, Univ. Louis Pasteur (France)
Chantal-Virginie Zint, Institut d'Electronique du Solide et des Systèmes, CNRS, Univ. Louis Pasteur (France)
Wilfried Uhring, Institut d'Electronique du Solide et des Systèmes, CNRS, Univ. Louis Pasteur (France)
Jean-Pierre Le Normand, Institut d'Electronique du Solide et des Systèmes, CNRS, Univ. Louis Pasteur (France)


Published in SPIE Proceedings Vol. 6187:
Photon Management II
John T. Sheridan; Frank Wyrowski, Editor(s)

© SPIE. Terms of Use
Back to Top