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Proceedings Paper

Comparing identically designed grayscale (50 phase level) and binary (5 phase levels) splitters: actual versus modeled performance
Author(s): Todd E. Lizotte; Orest P. Ohar; Tracie Tuttle
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Paper Abstract

Performance of diffractive optics is determined by high-quality design and a suitable fabrication process that can actually realize the design. Engineers who are tasked with developing or implementing a diffractive optic solution into a product need to take into consideration the risks of using grayscale versus binary fabrication processes. In many cases, grayscale design doesn't always provide the best solution or cost benefit during product development. This fabrication dilemma arises when the engineer has to select a source for design and/or fabrication. Engineers come face to face with reality in view of the fact that diffractive optic suppliers tend to provide their services on a "best effort basis". This can be very disheartening to an engineer who is trying to implement diffractive optics. This paper will compare and contrast the design and performance of a 1 to 24 beam, two dimensional; beam splitter fabricated using a fifty (50) phase level grayscale and a five (5) phase level binary fabrication methods. Optical modeling data will be presented showing both designs and the performance expected prior to fabrication. An overview of the optical testing methods used will be discussed including the specific test equipment and metrology techniques used to verify actual optical performance and fabricated dimensional stability of each optical element. Presentation of the two versions of the splitter will include data on fabrication dimensional errors, split beam-to-beam uniformity, split beam-to-beam spatial size uniformity and splitter efficiency as compared to the original intended design performance and models. This is a continuation of work from 2005, Laser Beam Shaping VI.

Paper Details

Date Published: 25 April 2006
PDF: 11 pages
Proc. SPIE 6187, Photon Management II, 61870C (25 April 2006); doi: 10.1117/12.661390
Show Author Affiliations
Todd E. Lizotte, Hitachi Via Mechanics USA Inc. (United States)
Orest P. Ohar, Hitachi Via Mechanics USA Inc. (United States)
Tracie Tuttle, Hitachi Via Mechanics USA Inc. (United States)


Published in SPIE Proceedings Vol. 6187:
Photon Management II
John T. Sheridan; Frank Wyrowski, Editor(s)

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