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Proceedings Paper

Quantitative confirmation of visual improvements to micro-CT bone density images
Author(s): John S. DaPonte; Michael Clark; Paul Nelson; Thomas Sadowski; Elizabeth Wood
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Paper Abstract

The primary goal of this research was to investigate the ability of quantitative variables to confirm qualitative improvements of the deconvolution algorithm as a preprocessing step in evaluating micro CT bone density images. The analysis of these types of images is important because they are necessary to evaluate various countermeasures used to reduce or potentially reverse bone loss experienced by some astronauts when exposed to extended weightlessness during space travel. Nine low resolution (17.5 microns) CT bone density image sequences, ranging from between 85 to 88 images per sequence, were processed with three preprocessing treatment groups consisting of no preprocessing, preprocessing with a deconvolution algorithm and preprocessing with a Gaussian filter. The quantitative parameters investigated consisted of Bone Volume to Total Volume Ratio, the Structured Model Index, Fractal Dimension, Bone Area Ratio, Bone Thickness Ratio, Euler's Number and the Measure of Enhancement. Trends found in these quantitative variables appear to corroborate the visual improvements observed in the past and suggest which quantitative parameters may be capable of distinguishing between groups that experience bone loss and others that do not..

Paper Details

Date Published: 12 May 2006
PDF: 9 pages
Proc. SPIE 6246, Visual Information Processing XV, 62460D (12 May 2006); doi: 10.1117/12.661306
Show Author Affiliations
John S. DaPonte, Southern Connecticut State Univ. (United States)
Michael Clark, Southern Connecticut State Univ. (United States)
Paul Nelson, Southern Connecticut State Univ. (United States)
Thomas Sadowski, Southern Connecticut State Univ. (United States)
Elizabeth Wood, Southern Connecticut State Univ. (United States)


Published in SPIE Proceedings Vol. 6246:
Visual Information Processing XV
Zia-ur Rahman; Stephen E. Reichenbach; Mark A. Neifeld, Editor(s)

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