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Proceedings Paper

Nanoscale mechanical investigations of tin oxide nanobelts: absolute modulus measurements
Author(s): Yuegui Zheng; Robert E. Geer
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Proc. SPIE 6175, Testing, Reliability, and Application of Micro- and Nano-Material Systems IV, 61750A; doi: 10.1117/12.661122
Show Author Affiliations
Yuegui Zheng, SUNY/Univ. at Albany (United States)
Robert E. Geer, SUNY/Univ. at Albany (United States)


Published in SPIE Proceedings Vol. 6175:
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
Robert E. Geer; Norbert Meyendorf; George Y. Baaklini; Dietmar W. Vogel, Editor(s)

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