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Proceedings Paper

Effects of optical back reflection on long wavelength VCSELs
Author(s): M. Steib; Y. Vandyshev; R. Johnson; G. Franz; Hongyu Deng
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Paper Abstract

Understanding of the noise characteristics of a long wavelength (LW) vertical cavity surface-emitting laser (VCSEL) under optical back reflection is crucial for its applications in optical fiber data communication. VCSELs at near 1.31μm are tested and the relative intensity noise (RIN) is measured in the presence of different levels of optical reflection intensity. Innovative LW VCSEL packaging solutions are demonstrated to achieve robust low cost error-free data communication systems.

Paper Details

Date Published: 10 February 2006
PDF: 11 pages
Proc. SPIE 6132, Vertical-Cavity Surface-Emitting Lasers X, 613205 (10 February 2006); doi: 10.1117/12.660841
Show Author Affiliations
M. Steib, Finisar Corp. (United States)
Y. Vandyshev, Finisar Corp. (United States)
R. Johnson, Advanced Optical Components (United States)
G. Franz, FH München (Germany)
Hongyu Deng, Finisar Corp. (United States)


Published in SPIE Proceedings Vol. 6132:
Vertical-Cavity Surface-Emitting Lasers X
Chun Lei; Kent D. Choquette, Editor(s)

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