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Proceedings Paper

Nanomaterials produced by laser ablation techniques. Part II: High spatially resolved nondestructive characterization of nanostructures
Author(s): Bernd Koehler; Paul Murray; Eunsung Shin; Sebastian Lipfert; Juergen Schreiber
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Paper Abstract

We studied nanoparticles by several high resolution microscopic methods as scanning electron microscopy (SEM), transmission electron microscopy (TEM) and scanning probe techniques especially atomic force microscopy (AFM) in contact and non-contact mode. While AFM in non-contact mode gives reliable information for 100 nm range nanoparticles it fails for smaller particles, showing lack of reproducibility. TEM and SEM prove to be reliable. By SEM imaging the agglomeration behavior and the structure of agglomerates are discussed in detail.

Paper Details

Date Published: 4 April 2006
PDF: 9 pages
Proc. SPIE 6175, Testing, Reliability, and Application of Micro- and Nano-Material Systems IV, 61750C (4 April 2006); doi: 10.1117/12.660463
Show Author Affiliations
Bernd Koehler, Fraunhofer Institute for Non-Destructive Testing, Dresden (Germany)
Paul Murray, Univ. of Dayton (United States)
Eunsung Shin, Univ. of Dayton (United States)
Sebastian Lipfert, Fraunhofer Institute for Material and Beam Technology (Germany)
Juergen Schreiber, Fraunhofer Institute for Non-Destructive Testing, Dresden (Germany)


Published in SPIE Proceedings Vol. 6175:
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
Robert E. Geer; Norbert Meyendorf; George Y. Baaklini; Dietmar W. Vogel, Editor(s)

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