Share Email Print

Proceedings Paper

Terahertz generalized Mueller-matrix ellipsometry
Author(s): T. Hofmann; U. Schade; C. M. Herzinger; P. Esquinazi; M. Schubert
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which was previously used in the FIR to VUV spectral range, is now employed for the first time to investigate condensed matter samples in the frequency range from 0.9 to 8 THz (30 to 650 cm-1). Exemplarily, results obtained from bound and unbound charge-carrier investigations in low-dimensional semi- and superconducting systems are presented. Future applications of this technique for investigation of charge-carrier dynamics in magnetic fields are envisioned.

Paper Details

Date Published: 7 March 2006
PDF: 7 pages
Proc. SPIE 6120, Terahertz and Gigahertz Electronics and Photonics V, 61200D (7 March 2006); doi: 10.1117/12.660382
Show Author Affiliations
T. Hofmann, Univ. of Nebraska-Lincoln (United States)
U. Schade, BESSY mbH (Germany)
C. M. Herzinger, J.A. Woollam Co., Inc. (United States)
P. Esquinazi, Univ. Leipzig (Germany)
M. Schubert, Univ. of Nebraska-Lincoln (United States)

Published in SPIE Proceedings Vol. 6120:
Terahertz and Gigahertz Electronics and Photonics V
R. Jennifer Hwu; Kurt J. Linden, Editor(s)

© SPIE. Terms of Use
Back to Top