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Proceedings Paper

Active sensing network system for crack detection on welded zone of steel truss member
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Paper Abstract

In this paper, a sensor network system based on an active sensing scheme is introduced to identify cracks which may occur at a welded zone of a steel truss member. The active sensing network system offers special potential for real world applications, as it is light, cheap, and useful as a built-in system. Four pairs of pitch-catch Lamb wave signals are utilized from the active sensing network system. In order to extract damage sensitive features from the dispersive Lamb waves, a robust wavelet transform is applied to the original response signals. Peak values in the wavelet coefficients corresponding to the A0 Lamb mode are only considered for application to the damage index. The root-mean-square change of the peak values due to damage is proposed as a damage index. In addition, a least-square curve-fitting algorithm is applied to the damage indices in order to obtain a practical damage indicator with a threshold value that presents the damage tolerance. Finally, damage localization is carried out by investigating the change rates of the damage index according to each damage step. The applicability of the proposed methods has been demonstrated by an experimental study.

Paper Details

Date Published: 11 April 2006
PDF: 11 pages
Proc. SPIE 6174, Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems, 61741A (11 April 2006); doi: 10.1117/12.660371
Show Author Affiliations
Seunghee Park, Virginia Polytechnic Institute and State Univ. (United States)
Chung-Bang Yun, Korea Advanced Institute of Science and Technology (South Korea)
Yongrae Roh, Kyungpook National Univ. (South Korea)
Daniel J. Inman, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 6174:
Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems
Masayoshi Tomizuka; Chung-Bang Yun; Victor Giurgiutiu, Editor(s)

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