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Proceedings Paper

Highly reliable high-power broad area laser diodes
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Paper Abstract

We report results of multi-cell life tests performed on nearly (500) laser diodes representing our new generation of very efficient high power broad area 9xx nm lasers. The acceleration model showed a steep power dependence of the failure rate with an exponent of nearly 6. Improvement in the facet passivation process resulted in significantly less power acceleration of failures. Analysis of the life test on upgraded lasers showed median lifetime of 1,500,000 hours at operating conditions of 8W and 350°C. Optical powers as high as 17.8W for thermally limited CW operation and 32W for 20 μs pulsed operation were recorded. The CW life test was complemented by a life test performed at power cycling conditions (1Hz repetition rate, 50% duty cycle).

Paper Details

Date Published: 15 February 2006
PDF: 10 pages
Proc. SPIE 6104, High-Power Diode Laser Technology and Applications IV, 610407 (15 February 2006); doi: 10.1117/12.660238
Show Author Affiliations
Victor Rossin, JDSU Corp. (United States)
Matthew Peters, JDSU Corp. (United States)
Erik Zucker, JDSU Corp. (United States)
Bruno Acklin, JDSU Corp. (United States)


Published in SPIE Proceedings Vol. 6104:
High-Power Diode Laser Technology and Applications IV
Mark S. Zediker, Editor(s)

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