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Proceedings Paper

Noninvasive measurement of on-chip RF field strength with application to RFID systems
Author(s): Behnam Jamali
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Proc. SPIE 6167, Smart Structures and Materials 2006: Smart Sensor Monitoring Systems and Applications, 61671K; doi: 10.1117/12.659634
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Behnam Jamali, The Univ. of Adelaide (Australia)


Published in SPIE Proceedings Vol. 6167:
Smart Structures and Materials 2006: Smart Sensor Monitoring Systems and Applications
Daniele Inaudi; Wolfgang Ecke; Brian Culshaw; Kara J. Peters; Eric Udd, Editor(s)

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