Share Email Print
cover

Proceedings Paper

Error factor in bottom CD measurement for contact hole using CD-SEM
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

CD control of hole bottom becomes more difficult with pattern size shrinkage. Since local CD variation of hole patterns is large, CD measurement by CD-SEM is needed for measuring the local CD. Although a technique of observing the hole bottom by CD-SEM has been reported, accuracy of bottom CD measurement is seldom examined. We estimated the tool precision and CD bias required for highly accurate CD control. As a result, the bottom CD measurement repeatability was examined for 0.94nm. Tool precision has sufficient capability for hp45 node. Si transfer process was the technique used for estimating CD bias. CD bias obtained by Si transfer process was constant in the bottom CD range of 45 nm or more. The above result indicates bottom CD measurement using CD-SEM has sufficient capability for measuring bottom CD correctly for hp45 node.

Paper Details

Date Published: 24 March 2006
PDF: 9 pages
Proc. SPIE 6152, Metrology, Inspection, and Process Control for Microlithography XX, 61524H (24 March 2006); doi: 10.1117/12.659555
Show Author Affiliations
Hideaki Abe, Toshiba Corp. (Japan)
Yuichiro Yamazaki, Toshiba Corp. (Japan)


Published in SPIE Proceedings Vol. 6152:
Metrology, Inspection, and Process Control for Microlithography XX
Chas N. Archie, Editor(s)

© SPIE. Terms of Use
Back to Top