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Proceedings Paper

UV-induced intrinsic Fabry-Perot interferometric sensors and their multiplexing for temperature and strain sensing
Author(s): Fabin Shen; Zhuang Wang; Wei Peng; Kristie Cooper; Gary Pickrell; Anbo Wang
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Paper Abstract

We present UV-induced intrinsic Fabry-Perot interferometric (IFPI) fiber sensors and a frequency-division-multiplexing (FDM) scheme for quasi-distributed temperature and strain sensing. We present a spectrum-based measurement system with a swept laser source to measure the fringe patterns of IFPI sensors serially arranged along a single fiber. The FDM scheme is based on the multiplexing of sub-carrier frequencies generated by the frequency-modulation of a continuouswave light source. IFPI sensors with different optical path differences (OPD) will have different sub-carrier frequencies. We use band pass filters to select individual frequency component and use frequency-estimation based signal processing algorithms to determine the OPD of each sensor. Experimental results for multiplexed temperature and strain sensing are demonstrated. The performance of the multiplexing system is discussed.

Paper Details

Date Published: 5 April 2006
PDF: 10 pages
Proc. SPIE 6174, Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems, 61740D (5 April 2006); doi: 10.1117/12.658979
Show Author Affiliations
Fabin Shen, Virginia Polytechnic Institute and State Univ. (United States)
Zhuang Wang, Virginia Polytechnic Institute and State Univ. (United States)
Wei Peng, Virginia Polytechnic Institute and State Univ. (United States)
Kristie Cooper, Virginia Polytechnic Institute and State Univ. (United States)
Gary Pickrell, Virginia Polytechnic Institute and State Univ. (United States)
Anbo Wang, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 6174:
Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems
Masayoshi Tomizuka; Chung-Bang Yun; Victor Giurgiutiu, Editor(s)

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