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Proceedings Paper

Dye-Enhanced Reflectance and Fluorescence Confocal Microscopy as an Optical Pathology Tool
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Paper Abstract

Early detection and precise excision of neoplasms are imperative requirements for successful cancer treatment. In this study we evaluated the use of dye-enhanced confocal microscopy as an optical pathology tool in the ex vivo trial with fresh thick non-melanoma skin cancer excisions and in vivo trial with B16F10 melanoma cancer in mice. For the experiments the tumors were rapidly stained using aqueous solutions of either toluidine blue or methylene blue and imaged using multimodal confocal microscope. Reflectance images were acquired at the wavelengths of 630nm and 650 nm. Fluorescence was excited at 630 nm and 650 nm. Fluorescence emission was registered in the range between 680 nm and 710 nm. The images were compared to the corresponding en face frozen H&E sections. The results of the study indicate confocal images of stained cancerous tissue closely resemble corresponding H&E sections both in vivo and in vitro. This remarkable similarity enables interpretation of confocal images in a manner similar to that of histopathology. The developed technique may provide an efficient real-time optical tool for detecting skin pathology.

Paper Details

Date Published: 22 February 2006
PDF: 7 pages
Proc. SPIE 6091, Optical Biopsy VI, 609107 (22 February 2006); doi: 10.1117/12.658303
Show Author Affiliations
Anna N. Yaroslavsky, Harvard Medical School, Massachusetts General Hospital (United States)
Elena Salomatina, Harvard Medical School, Massachusetts General Hospital (United States)
John Novak, Harvard Medical School, Massachusetts General Hospital (United States)
Ivan Amat-Roldan, Harvard Medical School, Massachusetts General Hospital (United States)
Ana Castano, Harvard Medical School, Massachusetts General Hospital (United States)
Michael Hamblin, Harvard Medical School, Massachusetts General Hospital (United States)


Published in SPIE Proceedings Vol. 6091:
Optical Biopsy VI
Robert R. Alfano; Alvin Katz, Editor(s)

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