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Proceedings Paper

Improving model-based OPC performance for sub-60nm devices using real source optical model
Author(s): Sunggon Jung; In-Sung Kim; Young-Seog Kang; Gi-Sung Yeo; Sang-Gyun Woo; HanKu Cho; Joo-Tae Moon
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Paper Abstract

In order to satisfy high density and cost effective production, extreme illumination condition, maximum sigma and OAI, is currently implemented at low k1 process. In this condition, minimal change of optical condition results in large difference of patterning. Specifically, blurring, intensity asymmetry and tele-centricity of illumination source cause deformation of some pitch patterns and CD asymmetry of semi-isolated patterns. In conventional modeling using ideal source optical model such as top-hat shape or profile, those data are regarded as noise terms since it is difficult to fit them well and such model inaccuracy produce OPC error. This paper provided results of the OPC performance using real source optical model obtained from a scanner. Real source image was filtered and normalized for easy handling. It was shown that we improved the model accuracy and significantly reduced the number of parameters. As a result, we increased process margin for sub-60nm device.

Paper Details

Date Published: 24 March 2006
PDF: 6 pages
Proc. SPIE 6156, Design and Process Integration for Microelectronic Manufacturing IV, 61561H (24 March 2006); doi: 10.1117/12.655954
Show Author Affiliations
Sunggon Jung, Samsung Electronics Co. (South Korea)
In-Sung Kim, Samsung Electronics Co. (South Korea)
Young-Seog Kang, Samsung Electronics Co. (South Korea)
Gi-Sung Yeo, Samsung Electronics Co. (South Korea)
Sang-Gyun Woo, Samsung Electronics Co. (South Korea)
HanKu Cho, Samsung Electronics Co. (South Korea)
Joo-Tae Moon, Samsung Electronics Co. (South Korea)


Published in SPIE Proceedings Vol. 6156:
Design and Process Integration for Microelectronic Manufacturing IV
Alfred K. K. Wong; Vivek K. Singh, Editor(s)

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