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Proceedings Paper

Complicated self-similarity of terrain surface
Author(s): Xutao Li; Hanqiang Cao; Guangxi Zhu; Shouyong Wang
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Paper Abstract

Fractal describes the self-similar phenomenon of signal and self-similarity is the most important character of fractal. Pentland provides an excellent explanation of the ruggedness of natural surface. Fractal-based description of image texture has been used effectively in characterization and segmentation of natural scene. A real surface is self-similar over some range of scales, rather than over all scales. That imply self-similarity of a terrain surface is not always so perfect that keep invariable in whole scale space. To describe such self-similarity distribution, a self-similarity curve could be plotted and was divided into several linear regions. We present a new parameter called Self-similarity Degree (SD) in the similitude of information entropy to denote such self-similarity distribution. In addition, one general characterization of self-similarities is result of physical processes. Terrain surface are created by the interactional inogenic and exogenic processes. Hereby, we introduce self-similarity analysis and multifractal singularity spectrum to describe such complex physical field. By the self-similarity analysis and singularity spectrum, the different self-similar structures and the interaction of processes in terrain surface were depicted. Our studies have shown that self-similarity is a relative notion and natural scenes own abundant self-similar structures. Moreover, noises always destroy the self-similarity of original natural surface and change the singularity distribution of original surface.

Paper Details

Date Published: 3 November 2005
PDF: 11 pages
Proc. SPIE 6044, MIPPR 2005: Image Analysis Techniques, 60441G (3 November 2005); doi: 10.1117/12.655217
Show Author Affiliations
Xutao Li, Huazhong Univ. of Science and Technology (China)
Hanqiang Cao, Huazhong Univ. of Science and Technology (China)
Guangxi Zhu, Huazhong Univ. of Science and Technology (China)
Shouyong Wang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6044:
MIPPR 2005: Image Analysis Techniques
Deren Li; Hongchao Ma, Editor(s)

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