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Proceedings Paper

Extraction of orthogonal incident state of polarization spectra using Mueller matrix approach
Author(s): Éric Desfonds; Kirill Pimenov; Samuel Weaver
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Paper Abstract

Novel algorithms based upon Mueller matrix terms are presented herein, which allow the recovery of the spectra associated with incident transverse electrical (TE) and transverse magnetic (TM) orthogonal states of polarization. These, in turn, give more insight into polarization-dependent frequency shifts and other performance-related parameters of interest. This elegant patent-pending solution entails little computational efforts and can significantly improved the testing capacity and capabilities of component designers and contract manufacturers.

Paper Details

Date Published: 3 March 2006
PDF: 13 pages
Proc. SPIE 6124, Optoelectronic Integrated Circuits VIII, 61240D (3 March 2006); doi: 10.1117/12.655201
Show Author Affiliations
Éric Desfonds, Cyrium Technologies Inc. (Canada)
Kirill Pimenov, OneChip Photonics Inc. (Canada)
Samuel Weaver, dBm Optics, Inc. (United States)


Published in SPIE Proceedings Vol. 6124:
Optoelectronic Integrated Circuits VIII
Louay A. Eldada; El-Hang Lee, Editor(s)

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