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Proceedings Paper

Measurement of coating thickness using ultrasonic resonance spectroscopy
Author(s): Stuart B. Palmer; Steve Dixon; Ben Lanyon; George Rowlands
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Paper Abstract

A technique has been developed whereby the thickness and elastic modulus of a coating applied to a substrate can be calculated from measurement of the resonant bulk wave ultrasonic modes of the combined substrate and coating. The density of the coating and the material properties of the substrate are required for this method. We have investigated the difference between models that take account of material attenuation and simpler models that do not and have found that there is little difference in the predicted resonant frequencies of the system for modes that can be observed in the experimental data. We have applied the technique to explain the experimental measurements for a 100μm thick epoxy resin coating curing on a 1mm thick aluminium substrate using wideband radially polarised SH shear waves. In this dynamic system the elastic properties of the coating change and particular resonant modes not only shift but can disappear or appear in the experimental data. A model is used to explain this behaviour and show that the technique has potential for coating thickness measurement in other areas. We have taken samples of 220μm thick aluminium sheet with a fully cured epoxy coating of nominal thickness 11μm, and have used ultrasonic measurements to calculate the thickness of the epoxy coating layer.

Paper Details

Date Published: 16 March 2006
PDF: 8 pages
Proc. SPIE 6179, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II, 61790B (16 March 2006); doi: 10.1117/12.654753
Show Author Affiliations
Stuart B. Palmer, Univ. of Warwick (United Kingdom)
Steve Dixon, Univ. of Warwick (United Kingdom)
Ben Lanyon, Univ. of Warwick (United Kingdom)
George Rowlands, Univ. of Warwick (United Kingdom)

Published in SPIE Proceedings Vol. 6179:
Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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