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Proceedings Paper

Automatic registration algorithm based on sensor parameters and image information
Author(s): Xiaodong Zhou; Songtao Liu; Hao Liu; Xuewei Wang
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Paper Abstract

IR and visible sensors are very common sensors adopted in the region of military image fusion, however, since there are less correlation and lack of consistent features between their acquired images, it is very difficult to achieve automatic registration of IR and visible images. In this paper, optoelectronic imaging anti-ship missile is taken as research object, and based on the analysis of its seeker's imaging process, we proposed a new automatic registration algorithm based on sensor parameters and image information. The basic idea of our algorithm is that decomposing the transform model, and simplifying it step by step. For example, the transform of IR and visible image registration is affine. By adjusting sensor parameters, the affine transform can be simplified to rigid transform through eliminating the scaling change between images, and by finding out the centroid of ship target's contour we can further eliminate the translational change between them. After image registration is achieved, the registration effect is assessed by judging whether the sea-sky-lines of the two registered images are in the same position. The final simulation experiments convince us that our algorithm has better performance on solving the difficult registration problem of small target images with different sensors.

Paper Details

Date Published: 3 November 2005
PDF: 9 pages
Proc. SPIE 6044, MIPPR 2005: Image Analysis Techniques, 60440L (3 November 2005); doi: 10.1117/12.654539
Show Author Affiliations
Xiaodong Zhou, Naval Aeronautical Engineering Institute (China)
Songtao Liu, Naval Aeronautical Engineering Institute (China)
Hao Liu, Research Institute of Naval Aeronautical Armament Demonstration (China)
Xuewei Wang, Naval Aeronautical Engineering Institute (China)


Published in SPIE Proceedings Vol. 6044:
MIPPR 2005: Image Analysis Techniques
Deren Li; Hongchao Ma, Editor(s)

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